Oxygen measurements by elastic backscattering
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference45 articles.
1. Backscattering Spectrometry;Chu,1978
2. Ion Beams for Materials Analysis;Bird,1989
3. Stoichiometry of thin silicon oxide layers on silicon
4. Physical conditions of computer analysis of ion backscattering
5. On the Mechanism of Low-Temperature Oxidation (23°–450°C) of Polycrystalline Nickel
Cited by 10 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Oxygen depth profiling by resonant backscattering and glow discharge optical emission spectroscopy of Ti-6Al-4V alloy oxidized by ion implantation and plasma based treatment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-10
2. AES and FTIR characterization of sol–gel alumina films;Journal of Non-Crystalline Solids;2012-06
3. Oxygen depth profiling in Kr+-implanted polycrystalline alpha titanium by means of 16O(α,α)16O resonance scattering;Journal of Nuclear Materials;2011-07
4. Oxygen depth profiling in prepared by sol-gel method using 16O(α, α)16O resonant backscattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03
5. Channeling analysis of oxygen in oxide materials using 16O(α, α)16O resonant backscattering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3