Principles and applications of ion beam techniques for the analysis of solids and thin films-Reference-Cited by-同舟云学术

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Principles and applications of ion beam techniques for the analysis of solids and thin films

Published:1973-07 Issue:1 Volume:17 Page:1-41
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Chu W.K.,Mayer J.W.,Nicolet M-A.,Buck T.M.,Amsel G.,Eisen F.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference126 articles.

1. Microanalysis of Materials by Backscattering Spectrometry

2. Chemical Composition of the Lunar Surface in Sinus Medii

3. Chemical analysis of surfaces using alpha particles

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