Heavy ion-induced characteristic X-rays as a tool in solid state physics-Reference-Cited by-同舟云学术

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Heavy ion-induced characteristic X-rays as a tool in solid state physics

Published:1971-04 Issue:4 Volume:92 Page:507-510
ISSN:0029-554X
Container-title:Nuclear Instruments and Methods
language:en
Short-container-title:Nuclear Instruments and Methods

Author:

Cairns J.A.

Publisher

Elsevier BV

Subject

General Medicine

Reference12 articles.

1. Characteristic X-Ray Production in theLIIIShell of Copper by Low-Energy (100- to 500-keV) Protons

2. Studies in X-Ray Production by Proton Bombardment of C, Mg, Al, Nd, Sm, Gd, Tb, Dy, and Ho

3. X-Ray Production in theLShell of Copper by 25- to 1700-eV Protons

4. D. M. Poole and J. L. Shaw, AERE (Harwell) R-5918.

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Impurity Profile of Implanted Ions in Silicon;Impurity Doping Processes in Silicon;1981

2. Literatur;Ionenimplantation;1978

3. Analysis Problems in Lattice Location Studies;Ion Beam Surface Layer Analysis;1976

4. Quantitative multielement analysis using high energy particle bombardment;Analytical Chemistry;1975-04-01

5. Ion-induced X-ray spectroscopy as a method to determine the depth distribution of trace elements;Nuclear Instruments and Methods;1975-02

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