Ion-induced X-ray spectroscopy as a method to determine the depth distribution of trace elements
Author:
Publisher
Elsevier BV
Subject
General Medicine
Reference12 articles.
1. X-ray analysis: Elemental trace analysis at the 10−12 g level
2. Heavy ion-induced characteristic X-rays as a tool in solid state physics
3. Proton induced X-ray emission as a tool for trace element analysis
4. Characteristic X-ray production by heavy ion bombardment as a technique for the examination of solid surfaces
5. Full‐range solution for the measurement of thin‐film surface densities with proton‐excited x rays
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