1. Auger electron emission from a Si(111) surface during 11-keV Ar+ ion sputtering;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2013-11
2. Dependence of Si+ and Si2+ sputtering yields on residual oxygen impurity;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-05
3. Neutralization phenomena observed with secondary ions originating from inner-shell excitation;Surface and Interface Analysis;2010-08-05
4. Effect of residual oxygen on ionization processes of Si+ and Si2+ sputtered from Si(111)-7×7 surface;Applied Surface Science;2008-12
5. Effect of residual oxygen in Si(111)-7×7 surface on Si+ and Si2+ sputter yields;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-05