Improvement in RF performance of 40-nm InAs-channel based HEMTs using Pt gate sinking with two-step recess processes technology

Author:

Kuo Chien-I,Hsu Heng-Tung,Wu Chien-Ying,Chang Edward Y.,Chen Yu-Lin,Lim Wee-Chin

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. 220-GHz metamorphic HEMT amplifier MMICs for high-resolution imaging applications

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3. Advanced mHEMT MMICs for 220 GHz high-resolution imaging systems

4. K.-S. Seo, D.H. Kim, in: Proc. 18th International Conference on Indium Phosphide and Related Materials, 2006, pp. 30–35.

5. K. Shinohara, P.S. Chen, J. Bergman, H. Kazemi, B. Brar, I. Watanabe, T. Matsui, Y. Yamashita, A. Endoh, K. Hikosaka, T. Mimura, S. Hiyamizu, in: IEEE Microwave Symposium Digest, 2006, pp. 337–340.

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1. Influence of HfAlOx in DC, RF and Microwave Noise Performance of Dual-Channel Single-Gate InAs MOSHEMT;Journal of Electronic Materials;2021-03-30

2. Noise analysis of double gate composite InAs based HEMTs for high frequency applications;Microsystem Technologies;2020-07-22

3. Analysis of microwave noise in an enhancement-mode dual-quantum-well InAs HEMT;Journal of Computational Electronics;2019-06-27

4. Sheet‐carrier density and I‐V analysis of In 0.7 Ga 0.3 As/InAs/In 0.7 Ga 0.3 As/InAs/In 0.7 Ga 0.3 As dual channel double gate HEMT for THz applications;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2019-05-30

5. Plume propagation and Pt film growth during shadow-masked pulsed laser deposition in a buffer Ar gas;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-01

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