Resistive bridge defect detection enhancement under parameter variations combining Low VDD and body bias in a delay based test-Reference-Cited by-同舟云学术

Resistive bridge defect detection enhancement under parameter variations combining Low VDD and body bias in a delay based test

Published:2012-11 Issue:11 Volume:52 Page:2799-2804
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Villacorta Hector,Champac Victor,Bota Sebastià,Segura Jaume

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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5. Kruseman A, Van Den Oetelaar S. Detection of resistive shorts in deep-submicron technologies. In: International test conference. Citeseer; 2003, p. 866–875.

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