Small-delay defect detection in the presence of process variations-Reference-Cited by-同舟云学术

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Small-delay defect detection in the presence of process variations

Published:2008-08 Issue:8 Volume:39 Page:1093-1100
ISSN:0026-2692
Container-title:Microelectronics Journal
language:en
Short-container-title:Microelectronics Journal

Author:

Tayade Rajeshwary,Abraham Jacob

Publisher

Elsevier BV

Subject

General Engineering

Reference17 articles.

1. Test method evaluation experiments and data;Nigh,2000

2. High volume microprocessor test escapes, an analysis of defects our tests are missing;Needham,1998

3. Iddq testing for CMOS VLSI;Rajsuman;Proc. IEEE,2000

4. MINVDD testing for weak CMOS ICs;Tseng,2001

5. Very-low-voltage testing for weak CMOS logic ICs;Hao,1993

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations;2024 IEEE European Test Symposium (ETS);2024-05-20

2. Robust Pattern Generation for Small Delay Faults Under Process Variations;2023 IEEE International Test Conference (ITC);2023-10-07

3. Fault-Tolerant Circuits;Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design;2023

4. A Technical Survey on Delay Defects in Nanoscale Digital VLSI Circuits;Applied Sciences;2022-09-10

5. Design Automation and Test Solutions for Monolithic 3D ICs;ACM Journal on Emerging Technologies in Computing Systems;2022-01-31

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