Analysis of ageing effects on ARTIX7 XILINX FPGA-Reference-Cited by-同舟云学术

Analysis of ageing effects on ARTIX7 XILINX FPGA

Published:2017-09 Issue: Volume:76-77 Page:168-173
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Slimani M.^ORCID,Benkalaia K.,Naviner L.

Funder

PISTIS

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. Degradation in FPGAs: measurement and modelling;Stott,2010

2. Design and implementation of a low cost test bench to assess the reliability of FPGA;Naouss;Microelectron. Reliab.,2015

3. The impact of aging on an FPGA-based physical unclonable function;Maiti,2011

4. Aging effects in FPGAs: an experimental analysis;Amouri,2014

5. Modelling degradation in FPGA lookup tables;Stott,2009

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