Cloning the Unclonable: Physically Cloning an FPGA Ring-Oscillator PUF
Author:
Affiliation:
1. Brigham Young University,Department of Electrical and Computer Engineering,Provo,Utah,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9973804/9974184/09974597.pdf?arnumber=9974597
Reference37 articles.
1. Recovery of negative and positive bias temperature stress in pMOSFETs
2. Modeling of NBTI-recovery effects in analog CMOS circuits
3. Anti-counterfeiting, key distribution, and key storage in an ambient world via physical unclonable functions
4. Localized electromagnetic analysis of RO PUFs
5. Unsupervised Recycled FPGA Detection Based on Direct Density Ratio Estimation
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3. A Study of High Temperature Effects on Ring Oscillator Based Physical Unclonable Functions;2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS);2023-07-03
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