Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA-Reference-Cited by-同舟云学术

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Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA

Published:2022-11 Issue: Volume:138 Page:114698
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Sobas J.,Airimitoaie T.-B.,Marc F.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. V. Boppana I. Ganusov V. Kathail V. Rajagopalan UltraScale MPSoC and FPGA Families, Xilinx.

2. Architectural enhancements in Intel® AgilexTM FPGAs;Chromczak,2020

3. A comparative study of reliability for finfet;Shaheen,2018

4. Long-term Reliability of Nanometer VLSI Systems Modeling, Analysis And Optimization;Mehdiitahoorii,2019

5. Justin S. J. Wong Pete Sedcole Peter Y. K. Cheung , A Transition Probability Based Delay Measurement Method for Arbitrary Circuits on FPGAs, International Conference on Field-Programmable TechnologyPublisher: International Conference on Field-Programmable Technology. ISBN: 9781424427963.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Degradation Measurement and Modelling under Ageing in a 16 nm FinFET FPGA;Micromachines;2023-12-22

2. Aging measurement and empirical modeling of BTI on FPGA using 16 nm FinFETs for static and dynamic stresses;Microelectronics Reliability;2023-11

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