Radiation Hardened by Design Latches — A Review and SEU Fault Simulations-Reference-Cited by-同舟云学术

Radiation Hardened by Design Latches — A Review and SEU Fault Simulations

Published:2018-04 Issue: Volume:83 Page:127-135
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Sajjade Faisal Mustafa^ORCID,Goyal Neeraj Kumar^ORCID,Varaprasad B.K.S.V.L.,Moogina Ravindra

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference47 articles.

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3. Poivey Christian, "Radiation hardness assurance for space systems," ed. NASA Goddard Space Flight Center, Greenbelt, MD United States: NASA Goddard Space Flight Center, 2002, pp. V-44-45.

4. Techniques for Radiation Effects Mitigation in ASICs and FPGAs Handbook;ECSS,2016

5. An SEU-hardened CMOS data latch design;Rockett;IEEE Trans. Nucl. Sci.,1988

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