An SEU-hardened CMOS data latch design-Reference-Cited by-同舟云学术

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An SEU-hardened CMOS data latch design

Published:1988 Issue:6 Volume:35 Page:1682-1687
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Rockett L.R.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx1/23/964/00025522.pdf?arnumber=25522

Cited by 72 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. A review on radiation‐hardened memory cells for space and terrestrial applications;International Journal of Circuit Theory and Applications;2022-09-07

4. Radiation Effects in a Post-Moore World;IEEE Transactions on Nuclear Science;2021-05

5. A fast simulation method for analysis of SEE in VLSI;Microelectronics Reliability;2021-05

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