Self-healing radiation-hardened latch design using 45-nm CMOS technology
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Publisher
AIP Publishing
Reference6 articles.
1. A Highly Robust and Low-Power Real-Time Double Node Upset Self-Healing Latch for Radiation-Prone Applications
2. Radiation Hardened by Design Latches — A Review and SEU Fault Simulations
3. L. T. Clark, “7 soft-error hardened latch and flip-flop design,” in Ionizing Radiation Effects in Electronics: From Memories to Imagers, p. 153 (2018).
4. HTNURL: Design of a High-Performance Low-Cost Triple-Node Upset Self-Recoverable Latch
5. A Highly Reliable and Energy-Efficient Triple-Node-Upset-Tolerant Latch Design
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