A Highly Robust and Low-Power Real-Time Double Node Upset Self-Healing Latch for Radiation-Prone Applications-Reference-Cited by-同舟云学术

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A Highly Robust and Low-Power Real-Time Double Node Upset Self-Healing Latch for Radiation-Prone Applications

Published:2021-12 Issue:12 Volume:29 Page:2076-2085
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Kumar Sandeep^ORCID,Mukherjee Atin^ORCID

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx7/92/9627316/09537906.pdf?arnumber=9537906

Cited by 27 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-07

2. IDLD: Interlocked Dual-Circle Latch Design with Low Cost and Triple-Node-Upset-Recovery for Aerospace Applications;Proceedings of the Great Lakes Symposium on VLSI 2024;2024-06-12

3. Low-Overhead Triple-Node-Upset Self-Recoverable Latch Design for Ultra-Dynamic Voltage Scaling Application;IEEE Transactions on Circuits and Systems I: Regular Papers;2024-06

4. Low-Cost and Highly Robust Quadruple Node Upset Tolerant Latch Design;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-05

5. An ultra low‐power double‐node‐upsets hardened latch design;International Journal of Circuit Theory and Applications;2024-03-24

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