Prediction of IGBT junction temperature using improved cuckoo search-based extreme learning machine-Reference-Cited by-同舟云学术

Prediction of IGBT junction temperature using improved cuckoo search-based extreme learning machine

Published:2021-09 Issue: Volume:124 Page:114267
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Liu Boying,Chen Guolong,Lin Hsiung-Cheng,Zhang Weipeng,Liu Jiaqi

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference51 articles.

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