Remaining useful life estimation for thermally aged power insulated gate bipolar transistors based on a modified maximum likelihood estimator-Reference-Cited by-同舟云学术

Remaining useful life estimation for thermally aged power insulated gate bipolar transistors based on a modified maximum likelihood estimator

Published:2020-02-27 Issue:6 Volume:30 Page:
ISSN:2050-7038
Container-title:International Transactions on Electrical Energy Systems
language:en
Short-container-title:Int Trans Electr Energ Syst

Author:

Ismail Adla¹,Saidi Lotfi¹²³^ORCID,Sayadi Mounir¹,Benbouzid Mohamed³⁴^ORCID

Affiliation:

1. Department of Electrical Engineering, Laboratory of Signal Image and Energy Mastery (SIME), ENSITUniversité de Tunis Tunisia

2. Departement of Electronics and Computer Engineering, ESSTHSUniversity of Sousse Sousse Tunisia

3. UMR CNRS 6027 IRDLUniversity of Brest Brest France

4. Logistics Engineering College, Shanghai Maritime University Shanghai China

Publisher

Hindawi Limited

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology,Modeling and Simulation

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/2050-7038.12358

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4. Future on Power Electronics for Wind Turbine Systems

5. A Literature Review of IGBT Fault Diagnostic and Protection Methods for Power Inverters

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