Author:
Dornic N.,Ibrahim A.,Khatir Z.,Degrenne N.,Mollov S.,Ingrosso D.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference22 articles.
1. Modelling for the lifetime prediction of power semiconductor modules;Kovacevic-Badstuebner;Reliability of Power Electronic Converter Systems,2015
2. Selected failure mechanisms of modern power modules;Ciappa;Microelectron. Reliab.,2002
3. Constant ΔTj power cycling strategy in DC mode for top-metal and bond-wire contacts degradation investigations;Tran;IEEE Transactions On Power Eelectronics,2019
4. Experimentally-validated models of on-state voltage for remaining useful life estimation and design for reliability of power modules;Degrenne,2018
5. Vce as early indicator of IGBT module failure mode;Pedersen,2017
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