Author:
Alaeddine A.,Kadi M.,Daoud K.,Mazari B.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference13 articles.
1. Electrical stress effect on RF power characteristics of SiGe hetero-junction bipolar transistors;Huang;Microelectron Reliab,2008
2. Cressler JD. Silicon heterostructure handbook. USA; 2006. p. 421, 525–38 [chapters 4.3 and 4.11].
3. Study of electrical stress effect on SiGe HBT LNA performance by simulation;Yu;IEEE Trans Dev Mater Reliab,2006
4. Applications of the near-field techniques in EMC investigations;Baudry;IEEE Trans EMC,2007
5. Characterization of electromagnetic fields close to microwave devices using electric dipole probes;Bouchelouk;Int J RF Microw Comput Aided Eng,2008
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