1. , , , , , and , Theoretical and experiment quantitative characterization of near fields of printed circuit board interconnection structures, IEEE International Symposium on EMC, Atlanta, GA, 1995, pp. 471–474.
2. and , Engineering applications of the modulated scatterer technique, Artech House, Boston, 2001.
3. , , , and , High-resolution electro-optic mapping of near-field distributions in integrated microwave circuits, IEEE MTT-S International Microwave Symposium, Baltimore, MD, 1998, pp. 949–952.
4. Measurement of VLSI power supply current by electron-beam probing
5. Field Strength Measurements in Resonant Cavities