Reliability prediction with MTOL-Reference-Cited by-同舟云学术

Reliability prediction with MTOL

Published:2017-01 Issue: Volume:68 Page:91-97
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Bernstein Joseph B.,Bensoussan Alain^ORCID,Bender Emmanuel

Funder

IRT Saint Exupery

AIRBUS Operations

Airbus Group Innovations

Continental Automotive France

Thales Alenia Space France

Thales Avionics

Hirex Engineering

Labinal Power Systems

Nexio

ANR

Air Force Office of Scientific Research

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Device Reliability Report, UG116 (v10.3.1);Xilinx,2015

2. Reliability Prediction from Burn-in Data Fit to Reliability Models;Bernstein,2014

3. Physics-of-Failure Based Handbook of Microelectronic Systems;Bernstein,2008

4. Reliability matrix solution to multiple mechanism prediction;Bernstein;Microelectron. Reliab.,2014

5. Joseph B. Bernstein, Reliability Prediction for Aerospace Electronics; IEEE Aerospace Conference, Paper Number 2042 (n.d.).

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