Unveiling structural characteristics for ultralow resistance drift in BiSb-Ge2Sb2Te5 materials for phase-change neuron synaptic devices
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials
Reference25 articles.
1. Unveiling the structural origin to control resistance drift in phase-change memory materials;Zhang;Mater. Today,2020
2. Recent advances on neuromorphic devices based on chalcogenide phase‐change materials;Xu;Adv. Funct. Mater.,2020
3. Reducing the stochasticity of crystal nucleation to enable subnanosecond memory writing;Rao;Science,2017
4. Suppressed resistance drift from short range order of amorphous GeTe ultrathin films;Ma;Appl. Phys. Lett.,2020
5. Role of mechanical stress in the resistance drift of Ge2Sb2Te5 films and phase change memories;Rizzi;Appl. Phys. Lett.,2011
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