Temperature dependence of infrared reflectance spectra of InN-Reference-Cited by-同舟云学术

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Temperature dependence of infrared reflectance spectra of InN

Published:2008-05 Issue:5 Volume:51 Page:482-484
ISSN:1350-4495
Container-title:Infrared Physics & Technology
language:en
Short-container-title:Infrared Physics & Technology

Author:

Kurihara K.,Yanagawa T.,Nakagawa N.,Fukui K.,Yamamoto A.

Publisher

Elsevier BV

Subject

Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference10 articles.

1. Infrared measurements of InN films at low temperatures

2. Disorder effects on infrared reflection spectra of InN films

3. Band-to-band and inner shell excitation VIS-UV photoluminescence of quaternary InAlGaN alloys

4. Correlations between electrical and optical properties for OMVPE InN

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optical characterization of free electron concentration in heteroepitaxial InN layers using Fourier transform infrared spectroscopy and a 2 × 2 transfer-matrix algebra;Journal of Applied Physics;2013-02-21

2. Temperature effects during the growth of InxGa1−xN films through the whole compositional range by plasma-assisted molecular beam epitaxy;Journal of Crystal Growth;2010-07

3. The influence of the group V/III molar precursor ratio on the structural properties of InGaN layers grown by HPCVD;physica status solidi (a);2010-05-25

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