Author:
Osten H.J.,Liu J.P.,Müssig H.-J.,Zaumseil P.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference4 articles.
1. Osten HJ, Liu JP, Gaworzewski P, Bugiel E, Zaumseil P. Tech Dig IEDM, IEEE, Piscatawy, NJ, 2000. p. 653
2. Ogasawara H, Kotani A, Potze R, Sawatzky GA, Thole BT. Phys Rev B 1991;44:5465
3. Tarsa EJ, Speck JS, Robinson McD. Appl Phys Lett 1993;63:539
4. High ε gate dielectrics Gd2O3 and Y2O3 for silicon
Cited by
23 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献