Investigation of the surface micro-roughness of fluoride films by spectroscopic ellipsometry-Reference-Cited by-同舟云学术

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Investigation of the surface micro-roughness of fluoride films by spectroscopic ellipsometry

Published:2001-10 Issue:1-2 Volume:397 Page:229-237
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Tikhonravov A.V.,Trubetskov M.K.,Krasilnikova A.V.,Masetti E.,Duparré A.,Quesnel E.,Ristau D.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference24 articles.

1. Nondestructive depth profiling of ZnS and MgO films by spectroscopic ellipsometry

2. Simultaneous determination of dispersion relation and depth profile of thorium fluoride thin film by spectroscopic ellipsometry

3. Simultaneous determination of refractive index, its dispersion and depth-profile of magnesium oxide thin film by spectroscopic ellipsometry

4. Simultaneous determination of refractive index, extinction coefficient, and void distribution of titanium dioxide thin film by optical methods

5. Regularization in ellipsometry

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1. Reverse engineering of e-beam deposited optical filters based on multi-sample photometric and ellipsometric data;Applied Optics;2022-12-13

2. Self-consistent optical constants of MgF_2, LaF_3, and CeF_3 films;Optical Materials Express;2017-02-21

3. Characterization of single LaF3 and MgF2 films on spherical substrate by planetary deposition;Thin Solid Films;2016-08

4. Reflectance and transmittance model for multilayer optical coatings with roughness at oblique incidence;Thin Solid Films;2015-10

5. Multilayers and optical constants of various fluorides in the far UV;SPIE Proceedings;2015-09-23

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