Simultaneous determination of refractive index, extinction coefficient, and void distribution of titanium dioxide thin film by optical methods-Reference-Cited by-同舟云学术

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Simultaneous determination of refractive index, extinction coefficient, and void distribution of titanium dioxide thin film by optical methods

Published:1996-12-01 Issue:34 Volume:35 Page:6703
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Kim S. Y.

Publisher

The Optical Society

Reference7 articles.

1. Comparison of the properties of titanium dioxide films prepared by various techniques

2. Automatic determination of the optical constants of inhomogeneous thin films

3. Derivation of Optical Constants of Metals from Thin-Film Measurements at Oblique Incidence

4. Generalized ellipsometric method for the determination of all the optical constants of the system: Optically absorbing film on an absorbing substrate

5. Ellipsometric study of anodic oxide growth: Application to the titanium oxide systems

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