Generalized ellipsometric method for the determination of all the optical constants of the system: Optically absorbing film on an absorbing substrate
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference5 articles.
1. Generalized Ellipsometric Method for the Absorbing Substrate Covered with a Transparent-Film System Optical Constants of Silicon at 3655 Å*
2. Ellipsometric function of a film–substrate system: Applications to the design of reflection-type optical devices and to ellipsometry*
3. Definitions and conventions in ellipsometry
4. Algorithm 419: zeros of a complex polynomial [C2]
5. Geometrically Exact Ellipsometer Alignment
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