Ellipsometric function of a film–substrate system: Applications to the design of reflection-type optical devices and to ellipsometry*
Author:
Publisher
The Optical Society
Subject
General Engineering
Reference4 articles.
1. Reflection Polarization by a Transparent-Film–Absorbing-Substrate System
2. Effect of film absorption on a film-substrate reflection polarizer
3. Wavelength Bandwidth and Other Design Aspects for Film–Substrate Reflection Polarizers
4. Ellipsometer Data Analysis with a Small Programmable Desk Calculator
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