Ellipsometric study of anodic oxide growth: Application to the titanium oxide systems
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference19 articles.
1. Ellipsometry and Polarized Light;Azzam,1977
2. Ellipsometric Technique for Obtaining Substrate Optical Constants
3. Ellipsometry in Thin Film Analysis
4. Ellipsometric analyses for an absorbing surface film on an absorbing substrate with or without an intermediate surface layer
5. Optical Evidence for a Silicon‐Silicon Oxide Interlayer
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