Ellipsometric analyses for an absorbing surface film on an absorbing substrate with or without an intermediate surface layer-Reference-Cited by-同舟云学术

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Ellipsometric analyses for an absorbing surface film on an absorbing substrate with or without an intermediate surface layer

Published:1976-06 Issue: Volume:56 Page:97-108
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

So Samuel S.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference10 articles.

1. Ellipsometry in the Measurement of Surfaces and Thin Films,1964

2. Proc. Symp. on Recent Developments in Ellipsometry,1969

3. Definitions and conventions in ellipsometry

Cited by 31 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Real Time Spectroscopic Ellipsometry Study on Growth Processes of ZrO[sub 2] Thin Films in Metallorganic Chemical Vapor Deposition;Journal of The Electrochemical Society;2001

2. Organometallic vapor phase epitaxy growth and optical characteristics of almost 1.2 μm GaInNAs three-quantum-well laser diodes;Applied Physics Letters;1999-08-23

3. Simultaneous measurement of film and substrate optical parameters from multiple sample single wavelength ellipsometric data;The European Physical Journal Applied Physics;1999-06

4. Study on Properties of Surface Solution Layer of K₄[Fe(CN)₆]/K₃[Fe(CN)₆] with Graze Ellipsometry;Acta Physico-Chimica Sinica;1998

5. Thickness dependence of refractive index for anodic aluminium oxide films;Journal of Materials Science Letters;1997

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