Simultaneous determination of refractive index, its dispersion and depth-profile of magnesium oxide thin film by spectroscopic ellipsometry
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Published:1989-07-15
Issue:14
Volume:28
Page:2691
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ISSN:0003-6935
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Container-title:Applied Optics
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language:en
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Short-container-title:Appl. Opt.
Author:
Vedam K.,Kim S. Y.
Publisher
The Optical Society
Cited by
33 articles.
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