Characterization of amorphous silicon carbon alloys by IBA technique and optical spectroscopy
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
Reference16 articles.
1. Physics of Amorphous Silicon–Carbon Alloys
2. Chemical (dis)order in a-Si1−xCx:H for x<0.6
3. Hydrogenated amorphous Si/SiC superlattice phototransistors
4. Graded-gap a-SiC:H p-i-n thin-film light-emitting diodes
5. Quantitative analysis of a-Si1−xCx:H thin films by vibrational spectroscopy and nuclear methods
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1. Optical Properties of Amorphous Silicon–Carbon Alloys (a-Si x C1-x ) Deposited by RF Co-Sputtering;Arabian Journal for Science and Engineering;2014-04-22
2. Ion beam analysis of a-C:H films on alloy steel substrate;Thin Solid Films;2013-10
3. Comparative investigation of the Si/SiO2 interface layer containing SiC crystallites using spectroscopic ellipsometry, ion beam analysis and XPS;physica status solidi (c);2008-05
4. Medium-range order in silicon oxycarbide glass by fluctuation electron microscopy;Journal of Physics: Condensed Matter;2007-10-24
5. Determination of stoichiometry in silicon carbide materials using elastic backscattering spectrometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-07
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