Medium-range order in silicon oxycarbide glass by fluctuation electron microscopy
Author:
Publisher
IOP Publishing
Subject
Condensed Matter Physics,General Materials Science
Link
http://stacks.iop.org/0953-8984/19/i=45/a=455205/pdf
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1. Plasma-enhanced chemical vapor deposition of low-kdielectric films using methylsilane, dimethylsilane, and trimethylsilane precursors
2. Optical and compositional analysis of functional SiOxCy:H coatings on polymers
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