Analytical and computational modeling of fluctuation electron microscopy from a nanocrystal/amorphous composite
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference38 articles.
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3. Quantifying nanoscale order in amorphous materials: simulating fluctuation electron microscopy of amorphous silicon;Bogle;Journal of Physics: Condensed Matter,2007
4. Comparison of fluctuation electron microscopy theories and experimental methods;Stratton;Journal of Physics: Condensed Matter,2007
5. A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous composite;Stratton;Ultramicroscopy,2008
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