Author:
Serafy Caleb,Shi Bing,Srivastava Ankur
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
8 articles.
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1. A Short Review of Through-Silicon via (TSV) Interconnects: Metrology and Analysis;Applied Sciences;2023-07-18
2. CoSn3 Intermetallic Nanoparticles for Electronic Packaging;Nanomaterials;2022-11-20
3. TSV-Based 3-D ICs: Design Methods and Tools;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2017-10
4. NaPer: A TSV Noise-Aware Placer;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2017-05
5. References;Three-Dimensional Integrated Circuit Design;2017