A geometric approach to chip-scale TSV shield placement for the reduction of TSV coupling in 3D-ICs

Author:

Serafy Caleb,Shi Bing,Srivastava Ankur

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A Short Review of Through-Silicon via (TSV) Interconnects: Metrology and Analysis;Applied Sciences;2023-07-18

2. CoSn3 Intermetallic Nanoparticles for Electronic Packaging;Nanomaterials;2022-11-20

3. TSV-Based 3-D ICs: Design Methods and Tools;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2017-10

4. NaPer: A TSV Noise-Aware Placer;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2017-05

5. References;Three-Dimensional Integrated Circuit Design;2017

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