Role of the emission depth distribution function in quantification of electron spectroscopies
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference39 articles.
1. Annual Book of ASTM Standards 2004, Vol. 03.06, Standard E 673-03, ASTM International, West Conshohocken, PA, 2004, p. 811.
2. Effects of elastic photoelectron collisions in quantitative XPS
3. Effects of Auger electron elastic scattering in quantitative AES
4. Comparison of electron attenuation lengths and escape depths with inelastic mean free paths
5. Influence of the matrix on boron detection by auger electron spectroscopy (AES)
Cited by 30 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Analytical formalism for calculations of parameters needed for quantitative analysis by X-ray photoelectron spectroscopy;Computer Physics Communications;2022-03
2. Universal analytical formula for the emission depth distribution function for photoelectrons with kinetic energies up to 5000 eV;Surface Science;2021-04
3. Effective Attenuation Lengths for Different Quantitative Applications of X-ray Photoelectron Spectroscopy;Journal of Physical and Chemical Reference Data;2020-09-01
4. A note on calculations of photoelectron partial intensities for energies reaching 4000 eV;Journal of Electron Spectroscopy and Related Phenomena;2019-07
5. The Chandrasekhar function for modeling photoelectron transport in solids;Computer Physics Communications;2019-02
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3