Analytical formalism for calculations of parameters needed for quantitative analysis by X-ray photoelectron spectroscopy-Reference-Cited by-同舟云学术

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Analytical formalism for calculations of parameters needed for quantitative analysis by X-ray photoelectron spectroscopy

Published:2022-03 Issue: Volume:272 Page:108233
ISSN:0010-4655
Container-title:Computer Physics Communications
language:en
Short-container-title:Computer Physics Communications

Author:

Jablonski A.^ORCID

Funder

Instytut Chemii Fizycznej PAN

Publisher

Elsevier BV

Subject

General Physics and Astronomy,Hardware and Architecture

Reference81 articles.

1. Auger-and X-ray Photoelectron Spectroscopy in Materials Science. A User-Oriented Guide;Hofman,2013

2. X-ray Photoelectron Spectroscopy. An Introduction to Principles and Practices;Van der Heide,2012

3. Surface and Interface Science,2012

4. Hard X-Ray Photoelectron Spectroscopy,2016

5. An Introduction to Surface Analysis by XPS and AES;Watts,2020

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1. Series representation of differential elastic scattering cross section for electrons: Applications in theoretical models of electron transport in condensed matter;Computer Physics Communications;2024-04

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