A note on calculations of photoelectron partial intensities for energies reaching 4000 eV-Reference-Cited by-同舟云学术

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A note on calculations of photoelectron partial intensities for energies reaching 4000 eV

Published:2019-07 Issue: Volume:234 Page:34-46
ISSN:0368-2048
Container-title:Journal of Electron Spectroscopy and Related Phenomena
language:en
Short-container-title:Journal of Electron Spectroscopy and Related Phenomena

Author:

Jablonski A.

Publisher

Elsevier BV

Subject

Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Radiation,Electronic, Optical and Magnetic Materials

Reference33 articles.

1. Electron Attenuation Lengths, in: Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy;Tanuma,2003

2. Spectroscopic databases and standardization for auger-electron spectroscopy and X-ray photoelectron spectroscopy;Jablonski,2012

3. Inelastic mean free paths, mean escape depths, information depths, and effective attenuation lengths for hard X-ray photoelectron spectroscopy;Powell,2016

4. Surface Chemical Analysis – Vocabulary, Part 1 – General Terms and Terms Used in Spectroscopy;ISO 18115-1,2013

5. Slowing down of medium-energy electrons in solids;Werner;Phys. Rev. B,1997

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effective Attenuation Lengths for Different Quantitative Applications of X-ray Photoelectron Spectroscopy;Journal of Physical and Chemical Reference Data;2020-09-01

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