Author:
Irace Andrea,Sirleto Luigi,Spirito Paolo,Vitale Giovanni F,Cutolo Antonello,Campopiano S,Zeni Luigi
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference33 articles.
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4. Surface recombination velocity measurements at the silicon–silicon dioxide interface by microwave‐detected photoconductance decay
5. Injection‐level‐dependent recombination velocities at the Si‐SiO2 interface for various dopant concentrations
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