Author:
Iwasaki K.,Tajima J.,Takayama H.,Pászti F.,Takai M.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
9 articles.
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1. Tertiary electrons in single-event time-of-flight Rutherford backscattering spectrometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-10
2. Simulation of fine focus time-of-flight Rutherford backscattering spectrometry using TRIM backscattering data;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-07
3. Improvement of depth resolution and detection efficiency by control of secondary-electrons in single-event three-dimensional time-of-flight Rutherford backscattering spectrometry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-04
4. Study on spatial resolution of three-dimensional analysis by full count TOF-RBS with beryllium nanoprobe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2012-02
5. Three dimensional measurement of nanostructures by single event TOF-RBS with nuclear nano probe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-10