A photomultiplier-based secondary electron imaging system for a nuclear microprobe

Author:

Alves L.C.,Breese M.B.H.,da Silva M.F.,Soares J.C.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference12 articles.

1. The Principles and Practise of Electron Microscopy;Watt,1997

2. A secondary electron imaging system for a nuclear microprobe

3. Influence of beam current fluctuation on secondary electron and RBS mapping images

4. E. Alves, M.R. da Silva, L.C. Alves, J.G. Marques, J.C. Soares, Internal report, ITER Task No. T431-EU, Association EURATOM/IST, December 2000

5. Study of the crystalline quality of exfoliated surfaces in hydrogen-implanted silicon

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