Author:
Younger P.A.,Cookson J.A.
Cited by
30 articles.
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1. High quality ion-induced secondary electron imaging for MeV nuclear microprobe applications;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;2004
2. A photomultiplier-based secondary electron imaging system for a nuclear microprobe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-04
3. A new approach to nuclear microscopy: the ion–electron emission microscope;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-09
4. A history of ion microbeams;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07
5. High resolution imaging with high energy ion beams;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-05