Die Sekundärelektronen-Ausbeute verschiedener Materialien bei Beschuß mit leichten Ionen hoher Energie / Secondary Electron Yield from Various Materials under the Impact of Light Ions at High Energies

Author:

Beck H. P.1,Langkau R.1

Affiliation:

1. Universität Hamburg, I. Institut für Experimentalphysik, Zyklotronlaboratorium, Hamburg

Abstract

Abstract The backward emission of secondary electrons from thick targets of graphite, aluminum, copper, molybdenum and tantalum under the impact of protons, deuterons, 3 He-ions and a-particles has been measured for incident energies in the MeV-range. The data are discussed within the scope of theoretical considerations based on low-energy studies taking into account the contribution due to ;< 5-rays.

Publisher

Walter de Gruyter GmbH

Subject

Physical and Theoretical Chemistry,General Physics and Astronomy,Mathematical Physics

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Suitability of some common polymer films for MeV proton beam dosimetry;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-07

2. Target-thickness-dependent electron emission from carbon foils bombarded with swift highly charged heavy ions;Physical Review A;1995-04-01

3. Kinetic electron emission from solid surfaces under ion bombardment;Particle Induced Electron Emission II;1992

4. Secondary electron imaging at the Heidelberg proton microprobe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1984-04

5. Data Compendium for Plasma-Surface Interactions;Nuclear Fusion;1984-01-01

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