Author:
Laird J.S,Hirao T,Mori H,Onoda S,Kamiya T,Itoh H
Subject
Instrumentation,Nuclear and High Energy Physics
Reference13 articles.
1. Alpha-, boron-, silicon- and iron-ion-induced current transients in low-capacitance silicon and GaAs diodes
2. Study of basic mechanisms of single event upset using high-energy microbeams
3. Effect of ion position on single-event transient current
4. Time-resolved ion beam induced charge collection (TRIBICC) in micro-electronics
5. J.S. Laird, R.A. Bardos, G.R. Moloney, A. Saint, G.J.F. Legge, in: J.S. Williams, R.G. Elliman, M.C. Ridgway (Eds.), Ion Beam Modification of Materials Proceedings, 1996
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