Effect of ion position on single-event transient current

Author:

Hirao Toshio,Nashiyama Isamu,Kamiya Tomihiro,Suda Tamotsu,Sakai Takuro,Hamano Tsuyoshi

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 21 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Analysis of location and LET dependence of single event transient in 14 nm SOI FinFET;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2022-11

2. Microbeam systems at TIARA;International Journal of PIXE;2015-01

3. Microbeam complex at TIARA: Technologies to meet a wide range of applications;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2011-10

4. Development of single-ion hit techniques and their applications at TIARA of JAERI Takasaki;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-06

5. Studies on single-event phenomena using the heavy-ion microbeam at JAERI;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-09

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