Author:
Nashiyama I.,Nishijima T.,Sekiguchi H.,Shimano Y.,Goka T.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
18 articles.
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1. Application of SEU imaging for analysis of device architecture using a 25 MeV/u 86 Kr ion microbeam at HIRFL;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2017-08
2. Radiation damage on 6H-SiC Schottky diodes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-09
3. Development of a new data collection system and chamber for microbeam and laser investigations of single event phenomena;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2001-07
4. Research of Si and GaAs diode structures by Ion Beam Induced Charge (IBIC) collection;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07
5. Study of basic mechanisms of semiconductor devices using ion beam induced charge (IBIC) collection;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07