Investigation of electrically-active deep levels in single-crystalline diamond by particle-induced charge transient spectroscopy-Reference-Cited by-同舟云学术

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Investigation of electrically-active deep levels in single-crystalline diamond by particle-induced charge transient spectroscopy

Published:2016-04 Issue: Volume:372 Page:151-155
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Kada W.,Kambayashi Y.,Ando Y.,Onoda S.,Umezawa H.,Mokuno Y.,Shikata S.,Makino T.,Koka M.,Hanaizumi O.,Kamiya T.,Ohshima T.

Funder

MEXT/JSPS

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference35 articles.

1. High Carrier Mobility in Single-Crystal Plasma-Deposited Diamond

2. Design and test of a high-speed single-particle beam monitor

3. CVD Diamond for Electronic Devices and Sensors;Sussmann,2009

4. CVD diamond for radiation detection devices

5. New materials for radiation hard semiconductor dectectors

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The perspectives of diamond for 3H and 63Ni betavoltaic power sources, comparison with 4H–SiC;AIP Advances;2023-10-01

2. Applications of carbon-based diamond detectors: A critical review;Materials Today Communications;2023-08

3. Recent progress in diamond radiation detectors;Functional Diamond;2021-01-02

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