Ion beam synthesis and characterization of thin SiC surface layers

Author:

Theodossiu E,Baumann H,Polychroniadis E.K,Bethge K

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Ion-beam synthesis and photoluminescence of SiC nanocrystals assisted by MeV-heavy-ion-beam annealing;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2012-07

2. Crystallization of β-SiC in thin SiC x layers (x = 0.03−1.40) synthesized by multiple implantation of carbon ions into silicon;Technical Physics;2011-02

3. Formation of Si/SiC multilayers by low-energy ion implantation and thermal annealing;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2010-03

4. AN INFLUENCE OF PLASMA TREATMENT ON STRUCTURE PROPERTIES OF THIN SiC FILMS ON Si;High Temperature Material Processes (An International Quarterly of High-Technology Plasma Processes);2010

5. High-energy heavy ion beam annealed ion-implantation-synthesized SiC nanocrystallites and photoluminescence;2010 3rd International Nanoelectronics Conference (INEC);2010-01

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