Electrical characterization of semiconductor nanowires by scanning-probe microscopy
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Elsevier
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Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Nanoscale tip positioning with a multi-tip scanning tunneling microscope using topography images;Review of Scientific Instruments;2022-01-01
2. Composition modulation by twinning in InAsSb nanowires;Nanotechnology;2019-05-21
3. Invited Review Article: Multi-tip scanning tunneling microscopy: Experimental techniques and data analysis;Review of Scientific Instruments;2018-10
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