Nanoscale tip positioning with a multi-tip scanning tunneling microscope using topography images-Reference-Cited by-同舟云学术

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Nanoscale tip positioning with a multi-tip scanning tunneling microscope using topography images

Published:2022-01-01 Issue:1 Volume:93 Page:013702
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Leis Arthur¹²³^ORCID,Cherepanov Vasily¹²^ORCID,Voigtländer Bert¹²³^ORCID,Tautz F. Stefan¹²³^ORCID

Affiliation:

1. Peter Grünberg Institut (PGI-3), Forschungszentrum Jülich, 52425 Jülich, Germany

2. Jülich Aachen Research Alliance (JARA), Fundamentals of Future Information Technology, 52425 Jülich, Germany

3. Experimentalphysik IV A, RWTH Aachen University, Otto-Blumenthal-Straße, 52074 Aachen, Germany

Funder

Deutsche Forschungsgemeinschaft

Publisher

AIP Publishing

Subject

Instrumentation

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0073059

Reference39 articles.

1. Anisotropy in Conductance of a Quasi-One-Dimensional Metallic Surface State Measured by a Square Micro-Four-Point Probe Method

2. Scattering of topological surface-state carriers at steps on surfaces

3. Dual-probe scanning tunneling microscope: Measuring a carbon nanotube ring transistor

4. A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials

5. Electronic Transport on the Nanoscale: Ballistic Transmission and Ohm’s Law

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A twist for tunable electronic and thermal transport properties of nanodevices;Nanoscale;2024

2. Probing Edge State Conductance in Ultra‐Thin Topological Insulator Films;Advanced Quantum Technologies;2022-08-02

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